Abstract:
X-ray computed microtomography is a powerful nondestructive technique for 2D and 3D structure analysis. However, parameters used in acquisition promote directs influence in qualitative and quantitative results in characterization of samples, due image resolution. The aim of this study is value the influence of theses parameters in results through of tests changing these parameters in different situations and scanner characterization. Results demonstrate that pixel size and detector matrix are the main parameters that influence in resolution and the necessity use additional filters for image quality. Microtomography was considered an excellent technique for characterization using the best image resolution possible.
