dc.contributor.author |
Landim, Regis Pinheiro |
|
dc.contributor.author |
Tang, Yi-hua |
|
dc.contributor.author |
Afonso, Edson |
|
dc.contributor.author |
Ferreira, Vitor |
|
dc.contributor.author |
Dotto, Marta Elisa Rosso |
|
dc.contributor.author |
Trota Filho, Jorge |
|
dc.contributor.author |
Marques, Alessandro |
|
dc.contributor.author |
Costa, Pedro Bastos |
|
dc.contributor.author |
Costa, Stella Regina Reis da |
|
dc.contributor.author |
Belaidi, Hakima |
|
dc.date.accessioned |
2020-07-20T00:47:50Z |
|
dc.date.available |
2020-07-20T00:47:50Z |
|
dc.date.issued |
2010 |
|
dc.identifier.citation |
LANDIM, Regis Pinheiro; TANG, Yi-hua; AFONSO, Edson; FERREIRA, Vitor.A 10 V Josephson Voltage Standard comparison between NIST and Inmetro as a link to BIPM. In: CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS (CPEM), 2010. Anais... Daejeon, Korea: IEEE, 2010. Disponível em: <http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=5543454>. |
|
dc.identifier.uri |
http://hdl.handle.net/123456789/1654 |
|
dc.description.abstract |
This paper describes a 10 V Josephson Voltage Standard (JVS)direct comparison between the National Institute of Standards and Technology (NIST) and the Instituto Nacional de Metrologia, Normalização e Qualidade Industrial (Inmetro)using automatic data acquisition. The results were in agreement to within 1.1 nV and the mean difference between the two JVSs at 10 V is 0.54 nV with a pooled combined standard uncertainty of 1.48 nV. Considering a recent JVS comparison between NIST and the Bureau International des Poids et Mesures (BIPM) [1], the difference between Inmetro and the BIPM thus was found to be −0.26 nV with a standard uncertainty of 1.76 nV. |
|
dc.format.extent |
2 p. : il. |
|
dc.language.iso |
eng |
|
dc.rights |
Open Access |
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dc.title |
A 10 V Josephson Voltage Standard comparison between NIST and Inmetro as a link to BIPM |
|
dc.type |
Artigo |
|
dc.subject.keyword |
Energia elétrica |
|
dc.subject.keyword |
Padrão de referência de energia |
|
dc.subject.keyword |
Incerteza de medição |
|